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U16. Surface Characterization and Calorimetry Unit

U16. Surface Characterization and Calorimetry Unit

U16-E04. ToF-SIMS 5 Time-of-flight secondary-ion mass spectrometry system (ION TOF )

ToF-SIMS 5 Time-of-flight secondary-ion mass spectrometry system (ION TOF ).

•• Sensitivity < 100 ppm. •• Lateral resolution ~ 100 nm (extension of surface area analyzed). •• Depth resolution ~ 1 nm (thickness of surface analyzed). •• Identification of molecules up to 10000 amu.

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U16-E03. K-Alpha X-ray photoelectron spectroscopy (XPS) system (Thermo)

K-Alpha X-ray photoelectron spectroscopy (XPS) system (Thermo):

•• Lateral resolution ~ 30-400 μm (extension of surface area analyzed).
•• Depth resolution ~ 10 nm (thickness of surface analyzed).
•• Depth profiles.

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U16-E02. UVISEL ellipsometer (Horiba JovinYvon)

UVISEL ellipsometer (Horiba JovinYvon), range 190-2100 nm, based on phase modulation with cell for liquid media:

•• Measurement of thicknesses from 0.1 nm to 30 μm.
•• Measurement of thickness of various superimposed layers.
•• Simultaneous measurement of the proportion of various different materials present on a surface.
•• Estimation of the porosity as percentage of pores vs. deposited material.
•• Measurement of roughness of coating between 2.5 and 15 nm.

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U16-E01. TAM III isothermal nanocalorimeter system. (TA Instruments)

TAM III isothermal nanocalorimeter system including options for titration and perfusion. Also solution quasi-adiabatic calorimetry is available. (TA Instruments). Thermostatic bath: •• Working temperatures between 15 and 150 ºC •• Temperature scan < 2 ºC/h •• Stability: /- 10 μK on short timescales and /- 100 μK drift over 24 hours Calorimetric response: •• Precision better than 100 nW •• Reproducibility better than 1% •• Stability: < 10 nW on short timescales and < 40 nW drift over 24 hours Solution: •• Maximum temperature 80ºC •• Quasi-adiabatic mode of operation

Temporarily OUT OF ORDER

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U16-S01. XPS (Remote) OUTSTANDING

Use of the system . X-ray photoelectron spectroscopy to measure quantitative elemental composition of surfaces (%) (except H and He).

Temporarily OUT OF ORDER

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U16-S02. Ellipsometry (Remote) OUTSTANDING

Use of the system to measure the thickness of layers, and the composition, porosity and roughness of materials on a surface.

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U16-S03. Calorimetry (Remote) OUTSTANDING

Tests in real time to measure:
·· Molecule-molecule interactions: Protein-protein, Receptor-ligand, Antibody-antigen, Biomaterial-molecule interactions, Biomaterial-cell interactions.
·· Microbial growth.
·· Cell metabolism.
Experiments of stability, growth,
etc, perfusion and dilution

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U16-S04. Characterization by Tof-SIM (Remote) OUTSTANDING

Surface analysis of organic and inorganic materials (mass spectrum), map of chemical elements present in the surface of the sample (image), profile analysis shows sample analysis in depth.

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