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U16. Surface Characterization and Calorimetry Unit – Equipment

U16. Surface Characterization and Calorimetry Unit – Equipment

U16-E04. ToF-SIMS 5 Time-of-flight secondary-ion mass spectrometry system (ION TOF )

ToF-SIMS 5 Time-of-flight secondary-ion mass spectrometry system (ION TOF ).

•• Sensitivity < 100 ppm. •• Lateral resolution ~ 100 nm (extension of surface area analyzed). •• Depth resolution ~ 1 nm (thickness of surface analyzed). •• Identification of molecules up to 10000 amu.

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U16-E03. K-Alpha X-ray photoelectron spectroscopy (XPS) system (Thermo)

K-Alpha X-ray photoelectron spectroscopy (XPS) system (Thermo):

•• Lateral resolution ~ 30-400 μm (extension of surface area analyzed).
•• Depth resolution ~ 10 nm (thickness of surface analyzed).
•• Depth profiles.

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U16-E02. UVISEL ellipsometer (Horiba JovinYvon)

UVISEL ellipsometer (Horiba JovinYvon), range 190-2100 nm, based on phase modulation with cell for liquid media:

•• Measurement of thicknesses from 0.1 nm to 30 μm.
•• Measurement of thickness of various superimposed layers.
•• Simultaneous measurement of the proportion of various different materials present on a surface.
•• Estimation of the porosity as percentage of pores vs. deposited material.
•• Measurement of roughness of coating between 2.5 and 15 nm.

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U16-E01. TAM III isothermal nanocalorimeter system. (TA Instruments)

TAM III isothermal nanocalorimeter system including options for titration and perfusion. Also solution quasi-adiabatic calorimetry is available. (TA Instruments). Thermostatic bath: •• Working temperatures between 15 and 150 ºC •• Temperature scan < 2 ºC/h •• Stability: /- 10 μK on short timescales and /- 100 μK drift over 24 hours Calorimetric response: •• Precision better than 100 nW •• Reproducibility better than 1% •• Stability: < 10 nW on short timescales and < 40 nW drift over 24 hours Solution: •• Maximum temperature 80ºC •• Quasi-adiabatic mode of operation

Temporarily OUT OF ORDER

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