U16-E04. ToF-SIMS 5 Time-of-flight secondary-ion mass spectrometry system (ION TOF )

ToF-SIMS 5 Time-of-flight secondary-ion mass spectrometry system (ION TOF ).

•• Sensitivity < 100 ppm. •• Lateral resolution ~ 100 nm (extension of surface area analyzed). •• Depth resolution ~ 1 nm (thickness of surface analyzed). •• Identification of molecules up to 10000 amu.