U6-E06. Perkin-Elmer DSC 8500 differential scanning calorimeter
Perkin-Elmer DSC 8500 differential scanning calorimeter.
+34 620 10 75 37info@nanbiosis.com
Perkin-Elmer DSC 8500 differential scanning calorimeter.
U6-E04. Nanosight LM -20 for Nanoparticle Tracking Analysis.
Malvern Zetasizer Nano ZS particle size analyzer.
High-pressure phase analyzer for studying the thermodynamic behaviour of materials
High-pressure laboratory-scale plant with 50, 100 and 300 ml reactors for the processing of biomaterials.
Specifications:
›› Three heads for injection of different materials:
•• Polymers
•• Ceramics
•• Living cells
›› Allowed viscosities ranging from 1 to 106 centipoises.
›› System for temperature and humidity control to enable the printing conditions to be adjusted. It is possible to create a microenvironment appropriate for each mixture of materials and proteins and to achieve high rates of cell viability.
›› Controlled by Software .
›› Visual monitoring system based on a digital camera, firewire cameras and high magnification lenses, with detection and measurement of colormetric/monochromatic variations.
›› Mapping system using a laser sensor for control of normal and extended working distances. It includes Target, Grid and Path mapping.
›› High-precision dispensing pump for dynamic control of the flow rate.
›› Position control system:
•• X/Y/Z accuracy: ±10 μm
•• X/Y reproducibility: ±2 μm
•• X/Y resolution: 0.5 μm
•• X/Y velocity: 304 mm/s (12”/s)
•• X/Y displacement: 304X 152 mm (12”X6”)
•• Z displacement: 101 mm (4”)
In addition, it should be noted that the system is sited in a clean room with a controlled environment and supply of the gases required for these tests.
• Spin-coater
– Rotational speed: 100 to 12.000 rpm.
– Vacuum chucks: 45 and 100 mm diameters. Designed to locked substrates firmly, without deflection, and operate at very high rotational speed.
– Fragment adapters: 3 to 10 mm; 5 to 25 mm; 10 to 50 mm. Holders with an O-ring seal to maintain the vacuum level and at the same time cushion the substrate.
• Optical Microscopy
– The Epi-illuminator with 12V/100w halogen lamp allows bright images to be obtained irrespective of the observation method used: brightfield, darkfield, Nomarski or polarized observations.
– Microscope objective lenses: 5x, 10x, 20x, and 100x.
– Minimum Fine focus gradation: 1 µm.
– Microscope camera head (1380×1027 pixels) ideal for image acquisition.
– Software specially designed to measure the distances of the features in the images. With these data, it is able to establish a scale bar that can be displayed on the image.
• Profilometer
– Computer controlled measurements
– High-resolution camera for color video of a 2.6 mm area.
– Variable intensity illumination for viewing samples with differing reflectivity.
– Stylus radius: 2.5 µm and 5 µm
– Stylus tracking force: 1-15 mg
– Vertical Range: up to 262 µm
– Scan Length Range: from 50 µm to 30 mm
– Vertical Resolution: down to 1 Å
– Horizontal Resolution is controlled by the scan speed
– Mechanical and optical components for sample placement, viewing and scanning.
– Manual Stage X-Y Position and sample stage rotation.
• Interferometer
– Measurement modes:
o Vertical Shift Interferometry (VSI), based on white light vertical scanning interferometry, is used for measuring features in the range of 140 nm to several µm.
o Phase Shift Interferometry (PSI), based on optical phase shifting, is dedicated to roughness measurements. Small features (1 to 140 nm) can be measured.
– The system has an automated stitching stage for large area coverage.E40
– Light Source: tungsten halogen lamp. Its brightness can be adjusted.
– 2 objective lenses included with the interferometer are available: Michelson (5.0X) and Mirau (50X).
– Field-of-View (FOV) Lenses available: 0.5, 1.0 and 2.0. FOV are lenses placed between the camera and the objective lens to adjust the field size of view.
– CCD camera to transfer the images to a computer for analysis.
– Software Vision32®. Enables advanced calculations of various surface parameters and image processing.
– Performance:
o Vertical measurement range: 0.1 nm to 1 mm
o Vertical resolution: 1 < 1 Å Ra
o Vertical scan speed up to 7.2 µm/sec
o Lateral spatial sampling 0.08 to 13.1 µm
o Field-of-View 8.24 mm to 0.05 mm (larger areas with data stitching mode)